"An Extended Class of Sequential Circuits with Combinational Test ..."

Michiko Inoue, Chikateru Jinno, Hideo Fujiwara (2002)

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DOI: 10.1109/ICCD.2002.1106770

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Michiko Inoue, Chikateru Jinno, Hideo Fujiwara:
An Extended Class of Sequential Circuits with Combinational Test Generation Complexity. ICCD 2002: 200-205

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