"LLM - TG: Towards Automated Test Case Generation for Processors Using ..."

Yifei Deng et al. (2024)

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DOI: 10.1109/ICCD63220.2024.00066

access: closed

type: Conference or Workshop Paper

metadata version: 2025-01-20

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Yifei Deng, Renzhi Chen, Chao Xiao, Zhijie Yang, Yuanfeng Luo, Jingyue Zhao, Na Li, Zhong Wan, Yongbao Ai, Huadong Dai, Lei Wang:
LLM - TG: Towards Automated Test Case Generation for Processors Using Large Language Models. ICCD 2024: 389-396

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