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"An efficient approach to pseudo-exhaustive test generation for BIST design."

Chien-In Henry Chen, Gerald E. Sobelman (1989)

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DOI: 10.1109/ICCD.1989.63431

access: closed

type: Conference or Workshop Paper

metadata version: 2022-11-10

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Chien-In Henry Chen, Gerald E. Sobelman:
An efficient approach to pseudo-exhaustive test generation for BIST design. ICCD 1989: 576-579

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