"Fast Generation of Statistically-based Worst-Case Modeling of On-Chip ..."

Norman Chang et al. (1997)

> Home

Details and statistics

DOI: 10.1109/ICCD.1997.628944

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

- view
  authority control:
- export record
  dblp key:
  - conf/iccd/ChangKNRO97
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/iccd/ChangKNRO97
Norman Chang, Valery Kanevsky, O. Sam Nakagawa, Khalid Rahmat, Soo-Young Oh:
Fast Generation of Statistically-based Worst-Case Modeling of On-Chip Interconnect. ICCD 1997: 720-725

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.