"Framework for massively parallel testing at wafer and package test."

A. Hakan Baba, Kee Sup Kim (2009)

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DOI: 10.1109/ICCD.2009.5413134

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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A. Hakan Baba, Kee Sup Kim:
Framework for massively parallel testing at wafer and package test. ICCD 2009: 328-334

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