"Test generation by fault sampling."

Vishwani D. Agrawal, Hassan Farhat, Sharad Seth (1988)

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DOI: 10.1109/ICCD.1988.25659

access: closed

type: Conference or Workshop Paper

metadata version: 2021-07-28

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Vishwani D. Agrawal, Hassan Farhat, Sharad Seth:
Test generation by fault sampling. ICCD 1988: 58-61

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