"Test Set Generation for Multiple Faults in Boolean Systems using SAT Solver."

P. Partha Koundinya et al. (2021)

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DOI: 10.1109/ICCCNT51525.2021.9579930

access: closed

type: Conference or Workshop Paper

metadata version: 2022-10-02

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P. Partha Koundinya, Sai Krishna Reddy Y, V. Mani Deepak, K. Rutwesh, Anuj Deshpande:
Test Set Generation for Multiple Faults in Boolean Systems using SAT Solver. ICCCNT 2021: 1-5

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