"Assessment of False Identity by Variability in Operating Condition for ..."

Ha-Phuong Nguyen et al. (2020)

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DOI: 10.1007/978-3-030-63007-2_49

access: closed

type: Conference or Workshop Paper

metadata version: 2024-05-07

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Ha-Phuong Nguyen, The-Nghia Nguyen, Nhat-An Nguyen, SungHyun Park, Yeong-Seok Seo, Dosam Hwang, Donghwa Shin:
Assessment of False Identity by Variability in Operating Condition for Memristor Write Time-Based Device Fingerprints. ICCCI 2020: 631-639

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