"Pseudo-functional testing for small delay defects considering power supply ..."

Feng Yuan, Xiao Liu, Qiang Xu (2011)

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DOI: 10.1109/ICCAD.2011.6105302

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Feng Yuan, Xiao Liu, Qiang Xu:
Pseudo-functional testing for small delay defects considering power supply noise effects. ICCAD 2011: 34-39

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