"An efficient method for parametric yield optimization of MOS integrated ..."

Tat-Kwan Yu et al. (1989)

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DOI: 10.1109/ICCAD.1989.76933

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Tat-Kwan Yu, Sung-Mo Kang, Jerome Sacks, William J. Welch:
An efficient method for parametric yield optimization of MOS integrated circuits. ICCAD 1989: 190-193

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