"Conflict driven techniques for improving deterministic test pattern ..."

Chen Wang et al. (2002)

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DOI: 10.1145/774572.774585

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Chen Wang, Sudhakar M. Reddy, Irith Pomeranz, Xijiang Lin, Janusz Rajski:
Conflict driven techniques for improving deterministic test pattern generation. ICCAD 2002: 87-93

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