"Worst-case analysis to obtain stable read/write DC margin of high density ..."

Yasumasa Tsukamoto et al. (2005)

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DOI: 10.1109/ICCAD.2005.1560101

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Yasumasa Tsukamoto, Koji Nii, Susumu Imaoka, Yuji Oda, Shigeki Ohbayashi, Tomoaki Yoshizawa, Hiroshi Makino, Koichiro Ishibashi, Hirofumi Shinohara:
Worst-case analysis to obtain stable read/write DC margin of high density 6T-SRAM-array with local Vth variability. ICCAD 2005: 398-405

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