"On average power dissipation and random pattern testability of CMOS ..."

Amelia Shen et al. (1992)

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DOI: 10.1109/ICCAD.1992.279338

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Amelia Shen, Abhijit Ghosh, Srinivas Devadas, Kurt Keutzer:
On average power dissipation and random pattern testability of CMOS combinational logic networks. ICCAD 1992: 402-407

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