"Statistical methodology to identify optimal placement of on-chip process ..."

Szu-Pang Mu et al. (2016)

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DOI: 10.1145/2966986.2967076

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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Szu-Pang Mu, Wen-Hsiang Chang, Mango C.-T. Chao, Yi-Ming Wang, Ming-Tung Chang, Min-Hsiu Tsai:
Statistical methodology to identify optimal placement of on-chip process monitors for predicting fmax. ICCAD 2016: 116

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