"A delay metric for RC circuits based on the Weibull distribution."

Frank Liu, Chandramouli V. Kashyap, Charles J. Alpert (2002)

Details and statistics

DOI: 10.1145/774572.774664

access: closed

type: Conference or Workshop Paper

metadata version: 2023-06-23

a service of  Schloss Dagstuhl - Leibniz Center for Informatics