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"Large-scale atomistic approach to random-dopant-induced characteristic ..."
Yiming Li et al. (2008)
- Yiming Li, Chih-Hong Hwang, Ta-Ching Yeh, Tien-Yeh Li:
Large-scale atomistic approach to random-dopant-induced characteristic variability in nanoscale CMOS digital and high-frequency integrated circuits. ICCAD 2008: 278-285
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