"A fast and memory-efficient diagnostic fault simulation for sequential ..."

Jer-Min Jou, Shung-Chih Chen (1994)

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DOI: 10.1109/ICCAD.1994.629903

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Jer-Min Jou, Shung-Chih Chen:
A fast and memory-efficient diagnostic fault simulation for sequential circuits. ICCAD 1994: 723-726

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