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"Automatic test pattern generation for delay defects using timed ..."
Shin-Yann Ho et al. (2013)
- Shin-Yann Ho, Shuo-Ren Lin, Ko-Lung Yuan, Chien-Yen Kuo, Kuan-Yu Liao, Jie-Hong R. Jiang, Chien-Mo James Li:
Automatic test pattern generation for delay defects using timed characteristic functions. ICCAD 2013: 91-98
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