"Optimal granularity of test generation in a distributed system."

Hideo Fujiwara, Tomoo Inoue (1989)

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DOI: 10.1109/ICCAD.1989.76926

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Hideo Fujiwara, Tomoo Inoue:
Optimal granularity of test generation in a distributed system. ICCAD 1989: 158-161

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