"Overall consideration of scan design and test generation."

Pao-Chuan Chen, Bin-Da Liu, Jhing-Fa Wang (1992)

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DOI: 10.1109/ICCAD.1992.279407

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Pao-Chuan Chen, Bin-Da Liu, Jhing-Fa Wang:
Overall consideration of scan design and test generation. ICCAD 1992: 9-12

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