"Optimal wafer probe testing and diagnosis of k-out-of-n structures."

Ming-Feng Chang, Weiping Shi, W. Kent Fuchs (1989)

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DOI: 10.1109/ICCAD.1989.76944

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Ming-Feng Chang, Weiping Shi, W. Kent Fuchs:
Optimal wafer probe testing and diagnosis of k-out-of-n structures. ICCAD 1989: 238-241

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