"Compact and complete test set generation for multiple stuck-faults."

Alok Agrawal et al. (1996)

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DOI: 10.1109/ICCAD.1996.569601

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Alok Agrawal, Alexander Saldanha, Luciano Lavagno, Alberto L. Sangiovanni-Vincentelli:
Compact and complete test set generation for multiple stuck-faults. ICCAD 1996: 212-219

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