"Automated Testing System for Switching Systems with Multiple Modules."

Kumiko Ono et al. (1997)

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DOI: 10.1109/ICC.1997.605213

access: closed

type: Conference or Workshop Paper

metadata version: 2020-07-22

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Kumiko Ono, Keisuke Ohmori, Toshiaki Fujii, Takeshi Asakura:
Automated Testing System for Switching Systems with Multiple Modules. ICC (1) 1997: 236-240

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