"A Novel Defect Classification Scheme Based on Convolutional Autoencoder ..."

Jaegyeong Cha, Juyong Park, Jongpil Jeong (2022)

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DOI: 10.23919/ICACT53585.2022.9728861

access: closed

type: Conference or Workshop Paper

metadata version: 2022-03-18

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Jaegyeong Cha, Juyong Park, Jongpil Jeong:
A Novel Defect Classification Scheme Based on Convolutional Autoencoder with Skip Connection in Semiconductor Manufacturing. ICACT 2022: 347-352

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