"New Classes of Blind Quantum Source Separation and Process Tomography ..."

Yannick Deville, Alain Deville (2018)

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DOI: 10.1007/978-3-319-93764-9_20

access: closed

type: Conference or Workshop Paper

metadata version: 2018-06-07

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Yannick Deville, Alain Deville:
New Classes of Blind Quantum Source Separation and Process Tomography Methods Based on Spin Component Measurements Along Two Directions. LVA/ICA 2018: 204-214

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