"Applicability of Quality Metrics for Ontologies on Ontology Design Patterns."

Rebekka Alm et al. (2013)

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DOI: 10.5220/0004541400480057

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-19

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Rebekka Alm, Sven Kiehl, Birger Lantow, Kurt Sandkuhl:
Applicability of Quality Metrics for Ontologies on Ontology Design Patterns. KEOD 2013: 48-57

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