"Development of drain current model for oxide semiconductor thin film ..."

Hiroshi Tsuji et al. (2012)

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DOI: 10.1109/IAS.2012.6374050

access: closed

type: Conference or Workshop Paper

metadata version: 2023-09-30

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Hiroshi Tsuji, Yoshiki Nakajima, Toshihiro Yamamoto, Mitsuru Nakata, Yoshihide Fujisaki, Hideo Fujikake, Hiroto Sato, Tatsuya Takei:
Development of drain current model for oxide semiconductor thin film transistors. IAS 2012: 1-5

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