"Surface impedance measurements in thin conducting films: Substrate and ..."

Nicola Pompeo, Kostiantyn Torokhtii, Enrico Silva (2017)

> Home

Details and statistics

DOI: 10.1109/I2MTC.2017.7969902

access: closed

type: Conference or Workshop Paper

metadata version: 2019-09-26

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/i2mtc/PompeoTS17
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/i2mtc/PompeoTS17
Nicola Pompeo, Kostiantyn Torokhtii, Enrico Silva:
Surface impedance measurements in thin conducting films: Substrate and finite-thickness-induced uncertainties. I2MTC 2017: 1-5

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.