"Trap Dynamic Detection of GaN HEMT under Repetitive Short Circuit Degradation."

Wenjuan Mei et al. (2023)

> Home

Details and statistics

DOI: 10.1109/I2MTC53148.2023.10176003

access: closed

type: Conference or Workshop Paper

metadata version: 2023-07-25

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/i2mtc/MeiPLSMZ23
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/i2mtc/MeiPLSMZ23
Wenjuan Mei, Chaowu Pan, Zhen Liu, Yuanzhang Su, Yusong Mei, Qi Zhou:
Trap Dynamic Detection of GaN HEMT under Repetitive Short Circuit Degradation. I2MTC 2023: 1-6

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.