"On the microwave photonics based pulsed-time-of-flight techniques in the ..."

Janne P. Aikio et al. (2017)

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DOI: 10.1109/I2MTC.2017.7969831

access: closed

type: Conference or Workshop Paper

metadata version: 2021-10-14

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Janne P. Aikio, Juha Kostamovaara, Markus Berg, Erkki T. Salonen:
On the microwave photonics based pulsed-time-of-flight techniques in the measurement of the thickness of dielectric sheets. I2MTC 2017: 1-6

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