"Defect Analysis and Cost-Effective Resilience Architecture for Future DRAM ..."

Sang-uhn Cha et al. (2017)

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DOI: 10.1109/HPCA.2017.30

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Sang-uhn Cha, Seongil O, Hyunsung Shin, Sangjoon Hwang, Kwang-Il Park, Seong-Jin Jang, Joo-Sun Choi, Gyo-Young Jin, Young Hoon Son, Hyunyoon Cho, Jung Ho Ahn, Nam Sung Kim:
Defect Analysis and Cost-Effective Resilience Architecture for Future DRAM Devices. HPCA 2017: 61-72

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