"Improved Device Driver Reliability Through Verification Reuse."

Leonid Ryzhyk et al. (2010)

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DOI: —

access: open

type: Conference or Workshop Paper

metadata version: 2021-02-02

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  - electronic edition @ usenix.org (open access)
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  dblp key:
  - conf/hotdep/RyzhykKMRVH10
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  persistent URL:
  - https://dblp.org/rec/conf/hotdep/RyzhykKMRVH10
Leonid Ryzhyk, John Keys, Balachandra Mirla, Arun Raghunath, Mona Vij, Gernot Heiser:
Improved Device Driver Reliability Through Verification Reuse. HotDep 2010

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