"PUF-based Secure Test Wrapper Design for Network-on-Chip."

Ying Zhang et al. (2022)

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DOI: 10.1109/HOST54066.2022.9840115

access: closed

type: Conference or Workshop Paper

metadata version: 2024-09-06

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Ying Zhang, Yuanxiang Li, Xin Chen, Jizhong Yang, Yifeng Hua, Jiaoyan Yao:
PUF-based Secure Test Wrapper Design for Network-on-Chip. HOST 2022: 181-184

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