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"Human Cognitive Reliability and R&D Efficiency: A Human Factor Study ..."
Yuanjun Li et al. (2024)
- Yuanjun Li, Mengya Zhu, Dengkai Chen, Yiting Yu:
Human Cognitive Reliability and R&D Efficiency: A Human Factor Study in Semiconductor Pilot Scale Production Line. HCI (10) 2024: 223-242
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