"A random walk model based approach for quantifying technology emergence ..."

Ying Xie, Vijay V. Raghavan (2012)

> Home

Details and statistics

DOI: 10.1109/GRC.2012.6468571

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

- view
  authority control:
- export record
  dblp key:
  - conf/grc/XieR12
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/grc/XieR12
Ying Xie, Vijay V. Raghavan:
A random walk model based approach for quantifying technology emergence and impact for research articles. GrC 2012: 553-555

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.