"FPGNN-ATPG: An Efficient Fault Parallel Automatic Test Pattern Generator."

Yuyang Ye et al. (2023)

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DOI: 10.1145/3583781.3590250

access: closed

type: Conference or Workshop Paper

metadata version: 2024-01-19

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Yuyang Ye, Zonghui Wang, Zun Xue, Ziqi Wang, Yifei Gao, Hao Yan:
FPGNN-ATPG: An Efficient Fault Parallel Automatic Test Pattern Generator. ACM Great Lakes Symposium on VLSI 2023: 299-304

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