"Deterministic broadside test generation for transition path delay faults."

Bo Yao, Irith Pomeranz, Sudhakar M. Reddy (2010)

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DOI: 10.1145/1785481.1785514

access: closed

type: Conference or Workshop Paper

metadata version: 2024-08-01

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Bo Yao, Irith Pomeranz, Sudhakar M. Reddy:
Deterministic broadside test generation for transition path delay faults. ACM Great Lakes Symposium on VLSI 2010: 135-138

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