"A taylor series methodology for analyzing the effects of process variation ..."

Raghuram Srinivasan, Harold W. Carter (2009)

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DOI: 10.1145/1531542.1531593

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-14

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Raghuram Srinivasan, Harold W. Carter:
A taylor series methodology for analyzing the effects of process variation on circuit operation. ACM Great Lakes Symposium on VLSI 2009: 203-208

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