"Scan testing of asynchronous sequential circuits."

O. A. Petlin, Stephen B. Furber (1995)

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DOI: 10.1109/GLSV.1995.516057

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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O. A. Petlin, Stephen B. Furber:
Scan testing of asynchronous sequential circuits. Great Lakes Symposium on VLSI 1995: 224-229

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