"An evaluation of the impact of gate oxide tunneling on ..."

Lara D. Oliver, Krishnendu Chakrabarty, Hisham Z. Massoud (2006)

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DOI: 10.1145/1127908.1127935

access: closed

type: Conference or Workshop Paper

metadata version: 2022-01-03

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Lara D. Oliver, Krishnendu Chakrabarty, Hisham Z. Massoud:
An evaluation of the impact of gate oxide tunneling on dual-V_t-based leakage reduction techniques. ACM Great Lakes Symposium on VLSI 2006: 105-110

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