"3D direct vertical interconnect microprocessors test vehicle."

John Mayega et al. (2003)

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DOI: 10.1145/764808.764846

access: closed

type: Conference or Workshop Paper

metadata version: 2025-01-19

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John Mayega, Okan Erdogan, Paul M. Belemjian, Kuan Zhou, John F. McDonald, Russell P. Kraft:
3D direct vertical interconnect microprocessors test vehicle. ACM Great Lakes Symposium on VLSI 2003: 141-146

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