"Optimization objectives and models of variation for statistical gate sizing."

Matthew R. Guthaus et al. (2005)

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DOI: 10.1145/1057661.1057736

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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Matthew R. Guthaus, Natesan Venkateswaran, Vladimir Zolotov, Dennis Sylvester, Richard B. Brown:
Optimization objectives and models of variation for statistical gate sizing. ACM Great Lakes Symposium on VLSI 2005: 313-316

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