"Improving the testability and reliability of sequential circuits with ..."

Nuno Alves et al. (2010)

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DOI: 10.1145/1785481.1785513

access: closed

type: Conference or Workshop Paper

metadata version: 2020-03-27

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Nuno Alves, Kundan Nepal, Jennifer Dworak, R. Iris Bahar:
Improving the testability and reliability of sequential circuits with invariant logic. ACM Great Lakes Symposium on VLSI 2010: 131-134

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