"Towards Robust Contrail Detection by Mitigating Label Bias via a ..."

Yejun Lee, Eun-Kyeong Kim, Jaejun Yoo (2023)

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DOI: 10.1145/3589132.3628364

access: closed

type: Conference or Workshop Paper

metadata version: 2024-11-14

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Yejun Lee, Eun-Kyeong Kim, Jaejun Yoo:
Towards Robust Contrail Detection by Mitigating Label Bias via a Probabilistic Deep Learning Model: A Preliminary Study. SIGSPATIAL/GIS 2023: 3:1-3:2

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