"A sensitivity analysis of microarray feature selection and classification ..."

Herman M. J. Sontrop et al. (2009)

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DOI: 10.1109/GENSIPS.2009.5174352

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type: Conference or Workshop Paper

metadata version: 2017-06-02

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Herman M. J. Sontrop, René van den Ham, Perry D. Moerland, Marcel J. T. Reinders, Wim F. J. Verhaegh:
A sensitivity analysis of microarray feature selection and classification under measurement noise. GENSiPS 2009: 1-4

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