"Functional Test Generation For Digital Integrated Circuits Using A Genetic ..."

Xiaoming Yu et al. (2002)

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type: Conference or Workshop Paper

metadata version: 2003-02-21

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Xiaoming Yu, Alessandro Fin, Franco Fummi, Elizabeth M. Rudnick:
Functional Test Generation For Digital Integrated Circuits Using A Genetic Algorithm. GECCO 2002: 1275

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