"Comparative Experiment of SPIN and SMT in Model Checking of Embedded ..."

Satoshi Yamane, Kosuke Uemura (2020)

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DOI: 10.1109/GCCE50665.2020.9291772

access: closed

type: Conference or Workshop Paper

metadata version: 2021-01-13

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Satoshi Yamane, Kosuke Uemura:
Comparative Experiment of SPIN and SMT in Model Checking of Embedded Assembly Program. GCCE 2020: 54-57

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