"A Contactless LSI Test Method Utilizing Direct Emission From On-Chip ..."

Hiroshi Kamiya et al. (2024)

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DOI: 10.1109/GCCE62371.2024.10760635

access: closed

type: Conference or Workshop Paper

metadata version: 2024-12-12

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Hiroshi Kamiya, Yamato Ishida, Satoru Honda, Hiroyuki Sato, Toshiki Kanamoto:
A Contactless LSI Test Method Utilizing Direct Emission From On-Chip Interconnects. GCCE 2024: 777-781

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