"Authenticity inspection by image recognition using feature point matching."

Ryo Inoue, Tomio Goto, Satoshi Hirano (2017)

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DOI: 10.1109/GCCE.2017.8229296

access: closed

type: Conference or Workshop Paper

metadata version: 2018-02-28

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Ryo Inoue, Tomio Goto, Satoshi Hirano:
Authenticity inspection by image recognition using feature point matching. GCCE 2017: 1-2

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