"Preliminary Study on Noise-Resilient Artificial Neural Networks for ..."

Tsutomu Inamoto et al. (2022)

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DOI: 10.1109/GCCE56475.2022.10014218

access: closed

type: Conference or Workshop Paper

metadata version: 2023-01-28

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Tsutomu Inamoto, Tomoki Nishino, Senling Wang, Yoshinobu Higami, Hiroshi Takahashi:
Preliminary Study on Noise-Resilient Artificial Neural Networks for On-Chip Test Generation. GCCE 2022: 561-565

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